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Automatic test equipment
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{{short description|none}} {{Multiple issues| {{Refimprove|date=April 2024}} {{Rewrite|date=April 2024}} }} [[File:Keithley-model4200-CVU.jpg|thumb|right|alt=Keithley Instruments Series 4200|[[Keithley Instruments]] Series 4200 CVU]] '''Automatic test equipment''' or '''automated test equipment''' ('''ATE''') is any apparatus that performs tests on a device, known as the [[device under test]] (DUT), equipment under test (EUT) or unit under test (UUT), using [[automation]] to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled [[Multimeter|digital multimeter]], or a complicated system containing dozens of complex test instruments (real or simulated [[electronic test equipment]]) capable of automatically testing and diagnosing faults in sophisticated electronic [[packaged part]]s or on [[wafer testing]], including [[system on chip]]s and [[integrated circuit]]s. ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test [[avionics]] and the electronic modules in automobiles. It is used in military applications like radar and wireless communication.
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