Open main menu
Home
Random
Recent changes
Special pages
Community portal
Preferences
About Wikipedia
Disclaimers
Incubator escapee wiki
Search
User menu
Talk
Dark mode
Contributions
Create account
Log in
Editing
Dry etching
(section)
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
{{short description|Controlled material removal, without the use of liquid substances}} {{refimprove|date=June 2016}} '''Dry etching''' refers to the removal of material, typically a masked pattern of [[semiconductor]] material, by exposing the material to a bombardment of [[ions]] (usually a [[plasma (physics)|plasma]] of reactive gases such as [[fluorocarbons]], [[oxygen]], [[chlorine]], [[boron trichloride]]; sometimes with addition of [[nitrogen]], [[argon]], [[helium]] and other gases) that dislodge portions of the material from the exposed surface. A common type of dry etching is [[reactive-ion etching]]. Unlike with many (but not all, see [[isotropic etching]]) of the wet chemical etchants used in [[Etching (microfabrication)|wet etching]], the dry etching process typically etches directionally or anisotropically.
Edit summary
(Briefly describe your changes)
By publishing changes, you agree to the
Terms of Use
, and you irrevocably agree to release your contribution under the
CC BY-SA 4.0 License
and the
GFDL
. You agree that a hyperlink or URL is sufficient attribution under the Creative Commons license.
Cancel
Editing help
(opens in new window)