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Electron microscope
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{{short description|Type of microscope with electrons as a source of illumination}} {{distinguish|Scanning tunneling microscope}} {{cs1 config|name-list-style=vanc|display-authors=6}} [[File:TITAN.jpg|thumb|A modern transmission electron microscope (TITAN)]]An '''electron microscope''' is a [[microscope]] that uses a beam of [[electron]]s as a source of illumination. They use [[electron optics]] that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing it to produce magnified images or [[electron diffraction]] patterns. As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher [[Angular resolution|resolution]] of about 0.1 nm, which compares to about 200 nm for [[optical microscope|light microscope]]s.<ref name="Encyclopaedia Britannica">{{cite web |title=Electron microscope |url=https://www.britannica.com/technology/electron-microscope |website=Encyclopaedia Britannica |access-date=June 26, 2024}}</ref> ''Electron microscope'' may refer to: * [[Transmission electron microscopy]] (TEM) where swift electrons go through a thin sample * [[Scanning transmission electron microscopy]] (STEM) which is similar to TEM with a scanned electron probe * [[Scanning electron microscope]] (SEM) which is similar to STEM, but with thick samples * [[Electron microprobe]] similar to a SEM, but more for chemical analysis * [[Low-energy electron microscopy]] (LEEM), used to image surfaces * [[Photoemission electron microscopy]] (PEEM) which is similar to LEEM using electrons emitted from surfaces by photons Additional details can be found in the above links. This article contains some general information mainly about transmission and scanning electron microscopes.
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