Editing Particle-induced X-ray emission (section)

{{short description|Non-destructive elemental analysis technique}}
'''Particle-Induced X-Ray Emission''' or '''Proton-Induced X-Ray Emission''' ('''PIXE''') is a technique used for determining the [[Chemical element|element]]al composition of a [[material]] or a [[Sample size determination|sample]]. When a material is exposed to an [[ion]] beam, atomic interactions occur that give off [[EM radiation]] of [[wavelength]]s in the [[x-ray]] part of the [[electromagnetic spectrum]] specific to an element. PIXE is a powerful, yet non-destructive elemental analysis technique now used routinely by geologists, archaeologists, art conservators and others to help answer questions of provenance, dating and [[Authenticity in art|authenticity]].

The technique was first proposed in 1970 by Sven Johansson of [[Lund University]], [[Sweden]], and developed over the next few years with his colleagues Roland Akselsson and Thomas B Johansson.<ref>[https://web.archive.org/web/20070911094752/http://wwwold.eat.lth.se/Staff/Roland/RApers/Mini-cv.htm Roland Akselsson mini-CV]- accessed 2008-01-29</ref>

Recent extensions of PIXE using tightly focused beams (down to 1 μm) gives the additional capability of [[Microscopy|microscopic analysis.]] This technique, called '''microPIXE''', can be used to determine the distribution of trace elements in a wide range of samples. A related technique, particle-induced gamma-ray emission (PIGE) can be used to detect some light elements.

Additionally a multiplexed instrument combining PIXE with Mass Spectrometry of molecules: PDI-PIXE-MS or PIXE-MS. See below.