Editing Automatic test equipment (section)

== In the semiconductor industry ==
Semiconductor ATE, named for testing [[semiconductor device]]s, can test a wide range of electronic devices and systems, from simple components ([[resistor]]s, [[capacitor]]s, and [[inductor]]s) to [[integrated circuit]]s (ICs), [[printed circuit board]]s (PCBs), and complex, completely assembled electronic systems. For this purpose, [[probe card]]s are used. ATE systems are designed to reduce the amount of test time needed to verify that a particular device works or to quickly find its faults before the part has a chance to be used in a final consumer product. To reduce manufacturing costs and improve yield, semiconductor devices should be tested after being fabricated to prevent defective devices ending up with the consumer.