Editing Scanning probe microscopy (section)

==Established types==
{{prose|section|date=November 2015}}
* AFM, [[atomic force microscopy]]<ref>{{cite journal | vauthors = Binnig G, Quate CF, Gerber C | title = Atomic force microscope | journal = Physical Review Letters | volume = 56 | issue = 9 | pages = 930–933 | date = March 1986 | pmid = 10033323 | doi = 10.1103/PhysRevLett.56.930 | doi-access = free | bibcode = 1986PhRvL..56..930B }}</ref>
** Contact AFM
** [[Non-contact atomic force microscopy|Non-contact AFM]]
** Dynamic contact AFM
** Tapping AFM
** AFM-IR
** CFM, [[chemical force microscopy]]
** C-AFM, [[conductive atomic force microscopy]]<ref>{{Cite journal | vauthors = Zhang L, Sakai T, Sakuma N, Ono T, Nakayama K | doi = 10.1063/1.125377 | volume = 75 | issue = 22 | pages = 3527–3529 | title = Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy | journal = Applied Physics Letters | year = 1999|bibcode = 1999ApPhL..75.3527Z }}</ref>
** EFM, [[electrostatic force microscopy]]<ref>{{Cite journal | vauthors = Weaver JM, Abraham DW | doi = 10.1116/1.585423 | volume = 9 | issue = 3 | pages = 1559–1561 | title = High resolution atomic force microscopy potentiometry | journal = Journal of Vacuum Science and Technology B | year = 1991|bibcode = 1991JVSTB...9.1559W }}</ref>
** KPFM, [[kelvin probe force microscope|kelvin probe force microscopy]]<ref>{{Cite journal | vauthors = Nonnenmacher M, O'Boyle MP, Wickramasinghe HK | doi = 10.1063/1.105227 | volume = 58 | issue = 25 | pages = 2921–2923 | title = Kelvin probe force microscopy | journal = Applied Physics Letters | year = 1991 | bibcode=1991ApPhL..58.2921N}}</ref>
** MIM, [[microwave impedance microscopy]]
** MFM, [[magnetic force microscopy]]<ref>{{Cite journal | doi = 10.1063/1.341836 | volume = 64 | issue = 3 | pages = 1561–1564 | vauthors = Hartmann U | title = Magnetic force microscopy: Some remarks from the micromagnetic point of view | journal = Journal of Applied Physics | year = 1988|bibcode = 1988JAP....64.1561H }}</ref>
** PFM, [[piezoresponse force microscopy]]<ref>{{Cite journal | vauthors = Roelofs A, Böttger U, Waser R, Schlaphof F, Trogisch S, Eng LM | doi = 10.1063/1.1328049 | volume = 77 | issue = 21 | pages = 3444–3446 | title = Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy | journal = Applied Physics Letters | year = 2000|bibcode = 2000ApPhL..77.3444R }}</ref>
** PTMS, [[photothermal microspectroscopy]]/microscopy
** SCM, [[scanning capacitance microscopy]]<ref>{{Cite journal | doi = 10.1063/1.334506 | volume = 57 | issue = 5 | pages = 1437–1444 | vauthors = Matey JR, Blanc J | title = Scanning capacitance microscopy | journal = Journal of Applied Physics | year = 1985|bibcode = 1985JAP....57.1437M }}</ref>
** SGM, [[scanning gate microscopy]]<ref>{{Cite journal | doi = 10.1063/1.117801 | volume = 69 | issue = 5 | pages = 671–673 | vauthors = Eriksson MA, Beck RG, Topinka M, Katine JA, Westervelt RM, Campman KL, Gossard AC | title = Cryogenic scanning probe characterization of semiconductor nanostructures | journal = Applied Physics Letters | date = July 29, 1996 | bibcode = 1996ApPhL..69..671E | doi-access = free }}</ref>
** SQDM, [[scanning quantum dot microscopy]]<ref>{{cite journal | vauthors = Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, Temirov R, Tautz FS | title = Scanning Quantum Dot Microscopy | journal = Physical Review Letters | volume = 115 | issue = 2 | pages = 026101 | date = July 2015 | pmid = 26207484 | doi = 10.1103/PhysRevLett.115.026101 | arxiv = 1503.07738 | s2cid = 1720328 | bibcode = 2015PhRvL.115b6101W }}</ref>
** SVM, [[scanning voltage microscopy]]<ref>{{Cite journal | doi = 10.1116/1.589812 | journal = Journal of Vacuum Science and Technology B | volume = 16 | issue = 1 | pages = 367–372 | vauthors = Trenkler T, De Wolf P, Vandervorst W, Hellemans L | title = Nanopotentiometry: Local potential measurements in complementary metal--oxide--semiconductor transistors using atomic force microscopy | year = 1998 |bibcode = 1998JVSTB..16..367T }}</ref>
** FMM, [[force modulation microscopy]]<ref>{{Cite conference | publisher = AVS | doi = 10.1116/1.587278 | conference = The 1993 international conference on scanning tunneling microscopy | volume = 12 | pages = 1526–1529 | vauthors = Fritz M, Radmacher M, Petersen N, Gaub HE | title = Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation | book-title = The 1993 international conference on scanning tunneling microscopy | location = Beijing, China | access-date = October 5, 2009 | date = May 1994 | url = http://link.aip.org/link/?JVB/12/1526/1 | bibcode = 1994JVSTB..12.1526F | doi-access = free | archive-date = March 5, 2016 | archive-url = https://web.archive.org/web/20160305094007/http://scitation.aip.org/content/avs/journal/jvstb/12/3/10.1116/1.587278 | url-status = dead }}</ref>
** TAFM, Tomographic AFM<ref>{{Cite journal | vauthors = Luria J, Kutes Y, Moore A, Zhang L, Stach EA, Huey BD |date=September 26, 2016 |title=Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy |url=https://www.nature.com/articles/nenergy2016150 |journal=Nature Energy |language=en |volume=1 |issue=11 |page=16150 |doi=10.1038/nenergy.2016.150 |bibcode=2016NatEn...116150L |osti=1361263 |s2cid=138664678 |issn=2058-7546}}</ref><ref>{{cite journal | vauthors = Steffes JJ, Ristau RA, Ramesh R, Huey BD | title = Thickness scaling of ferroelectricity in BiFeO<sub>3</sub> by tomographic atomic force microscopy | journal = Proceedings of the National Academy of Sciences of the United States of America | volume = 116 | issue = 7 | pages = 2413–2418 | date = February 2019 | pmid = 30683718 | pmc = 6377454 | doi = 10.1073/pnas.1806074116 | doi-access = free | bibcode = 2019PNAS..116.2413S }}</ref><ref>{{Cite journal | vauthors = Song J, Zhou Y, Huey BD | title = 3D structure–property correlations of electronic and energy materials by tomographic atomic force microscopy. | journal = Applied Physics Letters | date = February 2021 | volume = 118 | issue = 8 |url=https://pubs.aip.org/apl/article/118/8/080501/39967/3D-structure-property-correlations-of-electronic |access-date=March 11, 2024 |doi=10.1063/5.0040984| bibcode = 2021ApPhL.118h0501S | s2cid = 233931111 | url-access = subscription }}</ref>
* STM, [[scanning tunneling microscopy]]<ref>{{Cite journal | doi = 10.1063/1.92999 | volume = 40 | issue = 2 | pages = 178–180 | vauthors = Binnig G, Rohrer H, Gerber C, Weibel E | title = Tunneling through a controllable vacuum gap | journal = Applied Physics Letters | year = 1982|bibcode = 1982ApPhL..40..178B | doi-access = free }}</ref>
** BEEM, [[ballistic electron emission microscopy]]<ref>{{cite journal | vauthors = Kaiser WJ, Bell LD | title = Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy | journal = Physical Review Letters | volume = 60 | issue = 14 | pages = 1406–1409 | date = April 1988 | pmid = 10038030 | doi = 10.1103/PhysRevLett.60.1406 | bibcode = 1988PhRvL..60.1406K }}</ref>
** ECSTM [[electrochemical scanning tunneling microscope]]<ref>{{Cite journal | publisher = AVS | doi = 10.1116/1.589098 | volume = 14 | pages = 1360–1364 | vauthors = Higgins SR, Hamers RJ | title = Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope | journal = Journal of Vacuum Science and Technology B | access-date = October 5, 2009 | date = March 1996 | issue = 2 | url = http://link.aip.org/link/?JVB/14/1360/1 | bibcode = 1996JVSTB..14.1360H | archive-date = March 5, 2016 | archive-url = https://web.archive.org/web/20160305105359/http://scitation.aip.org/content/avs/journal/jvstb/14/2/10.1116/1.589098 | url-status = dead | url-access = subscription }}</ref>
** SHPM, [[scanning Hall probe microscopy]]<ref>{{Cite journal | doi = 10.1063/1.108334 | volume = 61 | issue = 16 | pages = 1974–1976 | vauthors = Chang AM, Hallen HD, Harriott L, Hess HF, Kao HL, Kwo J, Miller RE, Wolfe R, van der Ziel J, Chang TY | title = Scanning Hall probe microscopy | journal = Applied Physics Letters | year = 1992|bibcode = 1992ApPhL..61.1974C | s2cid = 121741603 }}</ref>
** SPSM [[spin polarized scanning tunneling microscopy]]<ref>{{Cite journal | doi = 10.1016/S0038-1098(01)00103-X | issn = 0038-1098 | volume = 119 | issue = 4–5 | pages = 341–355 | vauthors = Wiesendanger R, Bode M | title = Nano- and atomic-scale magnetism studied by spin-polarized scanning tunneling microscopy and spectroscopy | journal = Solid State Communications | date = July 25, 2001 | bibcode=2001SSCom.119..341W }}</ref>
** PSTM, [[photon scanning tunneling microscopy]]<ref>{{cite journal | vauthors = Reddick RC, Warmack RJ, Ferrell TL | title = New form of scanning optical microscopy | journal = Physical Review B | volume = 39 | issue = 1 | pages = 767–770 | date = January 1989 | pmid = 9947227 | doi = 10.1103/PhysRevB.39.767 | bibcode = 1989PhRvB..39..767R }}</ref>
** STP, [[scanning tunneling potentiometry]]<ref>[http://wwwex.physik.uni-ulm.de/lehre/physikalischeelektronik/phys_elektr/node252.html Vorlesungsskript Physikalische Elektronik und Messtechnik] {{in lang|de}}</ref>
** SXSTM, [[synchrotron x-ray scanning tunneling microscopy]]<ref>{{Cite book | publisher = Springer | doi = 10.1007/978-1-4419-7167-8_14 | edition = 1st | location = New York | pages = [https://archive.org/details/scanningprobemic00kali/page/n424 405]–431 | chapter = New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy | editor = Kalinin, Sergei V. |editor2=Gruverman, Alexei| title = Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy | url = https://archive.org/details/scanningprobemic00kali | url-access = limited | isbn = 978-1-4419-6567-7 | year = 2011 | vauthors = Volker R, Freeland JF, Streiffer SK }}</ref>
* SPE, Scanning Probe Electrochemistry
** SECM, [[scanning electrochemical microscopy]]
** SICM, [[scanning ion-conductance microscopy]]<ref>{{cite journal | vauthors = Hansma PK, Drake B, Marti O, Gould SA, Prater CB | title = The scanning ion-conductance microscope | journal = Science | volume = 243 | issue = 4891 | pages = 641–643 | date = February 1989 | pmid = 2464851 | doi = 10.1126/science.2464851 | bibcode = 1989Sci...243..641H }}</ref>
** SVET, [[scanning vibrating electrode technique]]
** SKP, [[scanning Kelvin probe]]
* FluidFM, [[fluidic force microscopy]]<ref name="MeisterGabi2009">{{cite journal | vauthors = Meister A, Gabi M, Behr P, Studer P, Vörös J, Niedermann P, Bitterli J, Polesel-Maris J, Liley M, Heinzelmann H, Zambelli T | title = FluidFM: combining atomic force microscopy and nanofluidics in a universal liquid delivery system for single cell applications and beyond | journal = Nano Letters | volume = 9 | issue = 6 | pages = 2501–2507 | date = June 2009 | pmid = 19453133 | doi = 10.1021/nl901384x | bibcode = 2009NanoL...9.2501M }}</ref>
* FOSPM, [[Feature-oriented scanning|feature-oriented scanning probe microscopy]]
* MRFM, [[magnetic resonance force microscopy]]<ref>{{Cite journal | doi = 10.1103/RevModPhys.67.249 | volume = 67 | issue = 1 | pages = 249–265 | vauthors = Sidles JA, Garbini JL, Bruland KJ, Rugar D, Züger O, Hoen S, Yannoni CS | title = Magnetic resonance force microscopy | journal = Reviews of Modern Physics | year = 1995 | bibcode=1995RvMP...67..249S}}</ref>
* NSOM, [[near-field scanning optical microscopy]] (or SNOM, scanning near-field optical microscopy)<ref>{{cite journal | vauthors = Betzig E, Trautman JK, Harris TD, Weiner JS, Kostelak RL | title = Breaking the diffraction barrier: optical microscopy on a nanometric scale | journal = Science | volume = 251 | issue = 5000 | pages = 1468–1470 | date = March 1991 | pmid = 17779440 | doi = 10.1126/science.251.5000.1468 | s2cid = 6906302 | bibcode = 1991Sci...251.1468B }}</ref>
** nano-FTIR, [[Nano-FTIR|broadband nanoscale SNOM-based spectroscopy]]<ref>{{cite journal | vauthors = Huth F, Govyadinov A, Amarie S, Nuansing W, Keilmann F, Hillenbrand R | title = Nano-FTIR absorption spectroscopy of molecular fingerprints at 20 nm spatial resolution | journal = Nano Letters | volume = 12 | issue = 8 | pages = 3973–3978 | date = August 2012 | pmid = 22703339 | doi = 10.1021/nl301159v | bibcode = 2012NanoL..12.3973H }}</ref>
* SSM, [[scanning SQUID microscopy]]
* SSRM, [[scanning spreading resistance microscopy]]<ref>{{Cite journal | doi = 10.1063/1.113636 | volume = 66 | issue = 12 | pages = 1530–1532 | vauthors = De Wolf P, Snauwaert J, Clarysse T, Vandervorst W, Hellemans L | title = Characterization of a point-contact on silicon using force microscopy-supported resistance measurements | journal = Applied Physics Letters | year = 1995|bibcode = 1995ApPhL..66.1530D }}</ref>
* SThM, [[scanning thermal microscopy]]<ref>{{Cite journal | doi = 10.1063/1.1145225 | volume = 65 | issue = 7 | pages = 2262–2266 | vauthors = Xu JB, Lauger L, Dransfeld K, Wilson IH | title = Thermal sensors for investigation of heat transfer in scanning probe microscopy | journal = Review of Scientific Instruments | year = 1994|bibcode = 1994RScI...65.2262X }}</ref>
* SSET [[scanning single-electron transistor microscopy]]<ref>{{cite journal | vauthors = Yoo MJ, Fulton TA, Hess HF, Willett RL, Dunkleberger LN, Chichester RJ, Pfeiffer LN, West KW | title = Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges | journal = Science | volume = 276 | issue = 5312 | pages = 579–582 | date = April 1997 | pmid = 9110974 | doi = 10.1126/science.276.5312.579 }}</ref>
* STIM, scanning thermo-ionic microscopy<ref>{{Cite journal| vauthors = Nasr Esfahani E, Eshghinejad A, Ou Y, Zhao J, Adler S, Li J |date=November 2017|title=Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation|journal=Microscopy Today|volume=25|issue=6|pages=12–19|doi=10.1017/s1551929517001043|issn=1551-9295|arxiv=1703.06184|s2cid=119463679}}</ref><ref>{{Cite journal| vauthors = Eshghinejad A, Nasr Esfahani E, Wang P, Xie S, Geary TC, Adler SB, Li J |date=May 28, 2016|title=Scanning thermo-ionic microscopy for probing local electrochemistry at the nanoscale|journal=Journal of Applied Physics|volume=119|issue=20|pages=205110|doi=10.1063/1.4949473|issn=0021-8979|bibcode=2016JAP...119t5110E|s2cid=7415218}}</ref>
* CGM, charge gradient microscopy <ref>{{cite journal | vauthors = Hong S, Tong S, Park WI, Hiranaga Y, Cho Y, Roelofs A | title = Charge gradient microscopy | journal = Proceedings of the National Academy of Sciences of the United States of America | volume = 111 | issue = 18 | pages = 6566–6569 | date = May 2014 | pmid = 24760831 | pmc = 4020115 | doi = 10.1073/pnas.1324178111 | doi-access = free | bibcode = 2014PNAS..111.6566H }}</ref><ref>{{Cite journal | vauthors = Esfahani EN, Liu X, Li J |title=Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis|journal=Journal of Materiomics|volume=3|issue=4|pages=280–285|doi=10.1016/j.jmat.2017.07.001|year=2017|arxiv=1706.02345|s2cid=118953680}}</ref>
* SRPM, scanning resistive probe microscopy <ref>{{cite journal| vauthors = Park H, Jung J, Min DK, Kim S, Hong S, Shin H |date=March 2, 2004|title=Scanning resistive probe microscopy: Imaging ferroelectric domains|journal=Applied Physics Letters|volume=84|issue=10|pages=1734–1736|doi=10.1063/1.1667266|issn=0003-6951|bibcode=2004ApPhL..84.1734P}}</ref>