Editing Built-in self-test (section)

==Specializations==

There are several specialized versions of BIST which are differentiated according to what they do or how they are implemented:

* [[pBIST | Programmable built-in self-test]] (pBIST)
* Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm<ref>Marinescu, M., 1982. Simple and Efficient Algorithms for Functional RAM Testing. 1982 IEEE Test Conference, Philadelphia, (Nov.). IEEE Computer Society, pp. 236-239.</ref>
* [[Logic built-in self-test]] (LBIST)
* Analog and mixed-signal built-in self-test (AMBIST)
* Continuous built-in self-test (CBIST, C-BIT)
* Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.
* Periodic built-in self-test (C-BIT/P-BIT)
* Interrupt-driven built-in self-test (IBIST) or user/operator-initiated built-in self-test (I-BIT, or O-BIT)
* Power-up built-in self-test (PupBIST, P-BIT)
* Automatic built-in self-test (ABIST)