Editing Ellipsometry (section)

===Ellipsometric porosimetry===
Ellipsometric porosimetry measures the change of the optical properties and thickness of the materials during adsorption and desorption of a volatile species at atmospheric pressure or under reduced pressure depending on the application.<ref>{{Cite web|url=https://semilab.com/category/products/ellipsometric-porosimetry-rd|title=Semilab &#124; Products|website=semilab.com}}</ref> The EP technique is unique in its ability to measure porosity of very thin films down to 10&nbsp;nm, its reproducibility and speed of measurement. Compared to traditional porosimeters, Ellipsometer porosimeters are well suited to very thin film pore size and pore size distribution measurement. Film porosity is a key factor in silicon based technology using [[low-κ dielectric|low-κ]] materials, organic industry (encapsulated [[organic light-emitting diode]]s) as well as in the coating industry using [[sol gel]] techniques.