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Atomic force microscopy
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===Topographic image of FM-AFM=== When the distance between the probe and the sample is brought to the range where atomic force may be detected, while a cantilever is excited in its natural eigenfrequency (''f''<sub>0</sub>), the resonance frequency ''f'' of the cantilever may shift from its original resonance frequency. In other words, in the range where atomic force may be detected, a frequency shift (''df'' =''f''β''f''<sub>0</sub>) will also be observed. When the distance between the probe and the sample is in the '''non-contact''' region, the frequency shift increases in negative direction as the distance between the probe and the sample gets smaller. When the sample has concavity and convexity, the distance between the tip-apex and the sample varies in accordance with the concavity and convexity accompanied with a scan of the sample along xβy direction (without height regulation in z-direction). As a result, the frequency shift arises. The image in which the values of the frequency obtained by a raster scan along the xβy direction of the sample surface are plotted against the xβy coordination of each measurement point is called a constant-height image. On the other hand, the df may be kept constant by moving the probe upward and downward (See (3) of FIG.5) in z-direction using a negative feedback (by using z-feedback loop) while the raster scan of the sample surface along the xβy direction. The image in which the amounts of the negative feedback (the moving distance of the probe upward and downward in z-direction) are plotted against the xβy coordination of each measurement point is a topographic image. In other words, the topographic image is a trace of the tip of the probe regulated so that the df is constant and it may also be considered to be a plot of a constant-height surface of the df. Therefore, the topographic image of the AFM is not the exact surface morphology itself, but actually the image influenced by the bond-order between the probe and the sample, however, the topographic image of the AFM is considered to reflect the geographical shape of the surface more than the topographic image of a scanning tunnel microscope.
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