Editing Ellipsometry (section)

===Magneto-optic generalized ellipsometry===
Magneto-optic generalized ellipsometry (MOGE) is an advanced infrared spectroscopic ellipsometry technique for studying free charge carrier properties in [[electrical conductor|conducting]] samples. By applying an external [[magnetic field]] it is possible to determine independently the [[electron density|density]], the optical [[electron mobility|mobility]] parameter and the [[effective mass (solid-state physics)|effective mass]] parameter of [[charge carrier|free charge carrier]]s. Without the magnetic field only two out of the three [[charge carrier|free charge carrier]] parameters can be extracted independently.