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Ellipsometry
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==Advantages== Ellipsometry has a number of advantages compared to standard reflection intensity measurements: * Ellipsometry measures at least two parameters at each wavelength of the spectrum. If generalized ellipsometry is applied up to 16 parameters can be measured at each wavelength. * Ellipsometry measures an intensity ratio instead of pure intensities. Therefore, ellipsometry is less affected by intensity instabilities of the light source or atmospheric absorption. * By using polarized light, normal ambient unpolarized [[stray light]] does not significantly influence the measurement, no dark box is necessary. * No reference measurement is necessary. Ellipsometry is especially superior to reflectivity measurements when studying anisotropic samples.
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