Editing Crystal oscillator (section)

=== Temperature ===
Temperature influences the operating frequency; various forms of compensation are used, from analog compensation (TCXO) and microcontroller compensation (MCXO) to stabilization of the temperature with a [[crystal oven]] (OCXO). The crystals possess temperature [[hysteresis]]; the frequency at a given temperature achieved by increasing the temperature is not equal to the frequency on the same temperature achieved by decreasing the temperature. The temperature sensitivity depends primarily on the cut; the temperature compensated cuts are chosen as to minimize frequency/temperature dependence. Special cuts can be made with linear temperature characteristics; the LC cut is used in quartz thermometers. Other influencing factors are the overtone used, the mounting and electrodes, impurities in the crystal, mechanical strain, crystal geometry, rate of temperature change, thermal history (due to hysteresis), ionizing radiation, and drive level.

Crystals tend to suffer anomalies in their frequency/temperature and resistance/temperature characteristics, known as activity dips. These are small downward frequency or upward resistance excursions localized at certain temperatures, with their temperature position dependent on the value of the load capacitors.