Editing Intensity (physics) (section)

==Electron beams==
For [[electron beams]], ''intensity'' is the probability of electrons reaching some particular position on a detector (e.g. a [[charge-coupled device]]<ref>{{Cite journal |last1=Spence |first1=J. C. H. |last2=Zuo |first2=J. M. |date=1988-09-01 |title=Large dynamic range, parallel detection system for electron diffraction and imaging |url=https://doi.org/10.1063/1.1140039 |journal=Review of Scientific Instruments |volume=59 |issue=9 |pages=2102–2105 |doi=10.1063/1.1140039 |bibcode=1988RScI...59.2102S |issn=0034-6748|url-access=subscription }}</ref>) which is used to produce images that are interpreted in terms of both [[microstructure]] of inorganic or biological materials, as well as [[atomic scale]] structure.<ref name=":0">{{Cite book |last=Cowley |first=J. M. |title=Diffraction physics |date=1995 |publisher=Elsevier |isbn=978-0-444-82218-5 |edition=3rd |series=North Holland personal library |location=Amsterdam}}</ref> The map of the intensity of scattered electrons or x-rays as a function of direction is also extensively used in [[crystallography]].<ref name=":0" /><ref>{{Cite book |last1=Cullity |first1=B. D. |title=Elements of X-ray diffraction |last2=Stock |first2=Stuart R. |date=2001 |publisher=Prentice Hall |isbn=978-0-201-61091-8 |edition=3rd |location=Upper Saddle River, NJ}}</ref>