Open main menu
Home
Random
Recent changes
Special pages
Community portal
Preferences
About Wikipedia
Disclaimers
Incubator escapee wiki
Search
User menu
Talk
Dark mode
Contributions
Create account
Log in
Editing
X-ray scattering techniques
(section)
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
===Elastic scattering=== * [[X-ray diffraction]], sometimes called Wide-angle X-ray diffraction (WAXD) * [[Small-angle X-ray scattering]] (SAXS) probes structure in the nanometer to micrometer range by measuring scattering intensity at scattering angles 2θ close to 0°. * [[X-ray reflectivity]] is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. * [[Wide-angle X-ray scattering]] (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. [[File:Schematic IXS spectrum.png|thumb|upright=1.25|Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering (IXS).]]
Edit summary
(Briefly describe your changes)
By publishing changes, you agree to the
Terms of Use
, and you irrevocably agree to release your contribution under the
CC BY-SA 4.0 License
and the
GFDL
. You agree that a hyperlink or URL is sufficient attribution under the Creative Commons license.
Cancel
Editing help
(opens in new window)