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Automatic test equipment
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=== Boundary scan=== [[Boundary scan]] can be implemented as a PCB-level or system-level interface bus for the purpose of controlling the pins of an IC and facilitating continuity (interconnection) tests on a test target (UUT) and also functional cluster tests on logic devices or groups of devices. It can also be used as a controlling interface for other instrumentation that can be embedded into the ICs themselves (see IEEE 1687) or instruments that are part of an external controllable test system.
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