Editing Flash memory (section)

===Data retention===
[[File:Micron_45_nm_NOR_Flash_Data_Retention.png|thumb|right|300px|45nm NOR flash memory example of data retention varying with temperatures]]
Data stored on flash cells is steadily lost due to electron detrapping{{Definition needed|data detrapping is not a familiar concept to the average wikipedia reader.|date=December 2022}}. The rate of loss increases exponentially as the [[absolute temperature]] increases. For example: For a 45&nbsp;nm NOR flash, at 1000 hours, the threshold voltage (Vt) loss at 25°C is about half that at 90°C.<ref>{{cite book
| last1 = Calabrese |first1 =Marcello|title =Proceedings of 2013 International Conference on IC Design & Technology (ICICDT)|chapter =Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology| date = May 2013 | chapter-url = https://ieeexplore.ieee.org/document/6563298 |pages =37–40| doi = 10.1109/ICICDT.2013.6563298 |isbn =978-1-4673-4743-3|s2cid =37127243| access-date = June 22, 2022}}</ref>