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== External links == * [https://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5412866 IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture] The official IEEE 1149.7 Standard. * {{web archive |url=https://web.archive.org/web/20140406211223/http://www.intel.com/content/dam/www/public/us/en/documents/white-papers/jtag-101-ieee-1149x-paper.pdf |title=JTAG 101 - IEEE 1149.x and Software Debug}}, Intel whitepaper on JTAG usage in system software debug across a wide range of architectures. * [http://www.ti.com/lit/an/ssya002c/ssya002c.pdf IEEE Std 1149.1 (JTAG) Testability Primer] Includes a strong technical presentation about JTAG, with design-for-test chapters. * [https://www.electronics-notes.com/articles/test-methods/boundary-scan-jtag-ieee1149/what-is-boundary-scan-jtag.php Boundary Scan / IEEE 1149 tutorial] including details of variants of the IEEE standard, BSDL, DFT, and other topics * [http://www.corelis.com/education/JTAG_Tutorial.htm JTAG Tutorial] Useful tutorials and information on JTAG technology. * [http://www.corelis.com/education/What-Is-JTAG.htm What is JTAG?] Useful information on JTAG, timeline, architecture and more. * [http://www.corelis.com/education/JTAG-Applications.htm JTAG Applications] JTAG for product development, life cycle, testing, tools needed, and other topics. {{IEEE standards}} {{Microcontrollers}} [[Category:IEEE standards]] [[Category:Electronics manufacturing]] [[Category:Embedded systems]] [[Category:Hardware testing]] [[Category:Printed circuit board manufacturing]]
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