Editing Lambert W function (section)

=== Materials science ===
The Lambert {{mvar|W}} function is employed in the field of [[Epitaxy|epitaxial film growth]] for the determination of the critical [[dislocation]] onset film thickness. This is the calculated thickness of an epitaxial film, where due to thermodynamic principles the film will develop crystallographic dislocations in order to minimise the elastic energy stored in the films. Prior to application of Lambert {{mvar|W}} for this problem, the critical thickness had to be determined via solving an implicit equation. Lambert {{mvar|W}} turns it in an explicit equation for analytical handling with ease.<ref>{{cite journal |last1=Braun |first1=Artur |last2=Briggs |first2=Keith M. |last3=Boeni |first3=Peter |title=Analytical solution to Matthews' and Blakeslee's critical dislocation formation thickness of epitaxially grown thin films |journal=J Cryst Growth |volume=241 |issue=1–2 |pages=231–234 |year=2003 |doi=10.1016/S0022-0248(02)00941-7 |bibcode=2002JCrGr.241..231B}}</ref>