Editing Two-port network (section)

===h-parameters history===
* D. A. Alsberg, "Transistor metrology", ''IRE Convention Record'', part 9, pp.&nbsp;39–44, 1953.
**also published as [https://ieeexplore.ieee.org/document/1471877/ "Transistor metrology"], ''Transactions of the IRE Professional Group on Electron Devices'', vol. ED-1, iss. 3, pp.&nbsp;12–17, August 1954.
* AIEE-IRE joint committee, [https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6372229 "Proposed methods of testing transistors"], ''Transactions of the American Institute of Electrical Engineers: Communications and Electronics'', pp.&nbsp;725–740, January 1955.
* [https://ieeexplore.ieee.org/document/4051913/ "IRE Standards on solid-state devices: methods of testing transistors, 1956"], ''Proceedings of the IRE'', vol. 44, iss. 11, pp.&nbsp;1542–1561, November, 1956.
* [https://ieeexplore.ieee.org/document/7370855/ ''IEEE Standard Methods of Testing Transistors''], IEEE Std 218-1956.

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{{DEFAULTSORT:Two-Port Network}}
[[Category:Two-port networks| ]]
[[Category:Transfer functions]]