Editing Automatic test equipment (section)

===Industrial PC===
<!-- Deleted image removed: [[File:apc-industrial-pc-large.jpg|thumb|Industrial PC]] -->

The [[industrial PC]] is a normal desktop computer packaged in 19-inch rack standards with sufficient PCI / PCIe slots for accommodating the Signal stimulator/sensing cards. This takes up the role of a controller in the ATE. Development of test applications and result storage is managed in this PC. Most modern semiconductor ATEs include multiple computer-controlled instruments to source or measure a wide range of parameters. The instruments may include device power supplies (DPS),<ref>{{cite book|url=https://books.google.com/books?id=8P3iLCGbfp0C&q=%22device+power+supplies%22+DPS&pg=PA160|author=Jose Moreira, Hubert Werkmann|title=An Engineer's Guide to Automated Testing of High-Speed Interfaces|publisher=[[Artech House]]|date=2010|isbn=9781607839842|accessdate=2015-10-12}}</ref><ref>{{cite book| url=https://books.google.com/books?id=A6oYzUj1_jYC&q=device+power+supplies+DPS&pg=PA269| title=Demystifying Mixed Signal Test Methods|publisher=[[Elsevier]]|date=3 June 2003|author=Mark Baker| isbn=9780080491066|accessdate=2015-10-12}}</ref> parametric measurement units (PMU), arbitrary waveform generators (AWG), digitizers, digital IOs, and utility supplies. The instruments  perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times. Based on the requirement of response-time, real-time systems are also considered for stimulation and signal capturing.