Editing Electron mobility (section)

=== Time resolved microwave conductivity (TRMC) ===
{{main|Time resolved microwave conductivity}}

A proxy for charge carrier mobility can be evaluated using time-resolved microwave conductivity (TRMC).<ref>{{Cite journal| last1=Savenije|first1=Tom J.|last2=Ferguson|first2=Andrew J.|last3=Kopidakis|first3=Nikos|last4=Rumbles|first4=Garry| date=2013-11-21| title=Revealing the Dynamics of Charge Carriers in Polymer:Fullerene Blends Using Photoinduced Time-Resolved Microwave Conductivity|url=https://doi.org/10.1021/jp406706u|journal=The Journal of Physical Chemistry C|volume=117|issue=46 |pages=24085–24103|doi=10.1021/jp406706u|issn=1932-7447|url-access=subscription}}</ref> A pulsed optical laser is used to create electrons and holes in a semiconductor, which are then detected as an increase in photoconductance. With knowledge of the sample absorbance, dimensions, and incident laser fluence, the parameter <math>\phi\Sigma\mu=\phi(\mu_{e}+\mu_{h})</math> can be evaluated, where <math>\phi</math> is the carrier generation yield (between 0 and 1), <math>\mu_{e}</math> is the electron mobility and <math>\mu_{h}</math> is the hole mobility. <math>\phi\Sigma\mu</math> has the same dimensions as mobility, but carrier type (electron or hole) is obscured.