Editing Dynamic range (section)

== Metrology ==
{{More citations needed section|date=June 2009}}
In [[metrology]], such as when performed in support of science, engineering or manufacturing objectives, dynamic range refers to the range of values that can be measured by a sensor or metrology instrument. Often this dynamic range of measurement is limited at one end of the range by saturation of a sensing signal sensor or by physical limits that exist on the motion or other response capability of a mechanical indicator. The other end of the dynamic range of measurement is often limited by one or more sources of random [[noise]] or uncertainty in signal levels that may be described as defining the [[Sensitivity (electronics)|sensitivity]] of the sensor or metrology device. When digital sensors or sensor signal converters are a component of the sensor or metrology device, the dynamic range of measurement will be also related to the number of binary digits (bits) used in a digital numeric representation in which the measured value is linearly related to the digital number.<ref name=slyusar/> For example, a 12-bit digital sensor or converter can provide a dynamic range in which the ratio of the maximum measured value to the minimum measured value is up to 2<sup>12</sup> = 4096.

Metrology systems and devices may use several basic methods to increase their basic dynamic range. These methods include averaging and other forms of filtering, correction of receivers characteristics,<ref name=slyusar/> repetition of measurements, nonlinear transformations to avoid saturation, etc. In more advance forms of metrology, such as multiwavelength [[digital holography]], [[interferometry]] measurements made at different scales (different wavelengths) can be combined to retain the same low-end resolution while extending the upper end of the dynamic range of measurement by orders of magnitude.