Open main menu
Home
Random
Recent changes
Special pages
Community portal
Preferences
About Wikipedia
Disclaimers
Incubator escapee wiki
Search
User menu
Talk
Dark mode
Contributions
Create account
Log in
Editing
Transistor
(section)
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
===MOSFET (MOS transistor)=== {{Main|MOSFET}} [[File:1957(Figure_9)-Gate_oxide_transistor_by_Frosch_and_Derrick.png|thumb|310x310px|Diagram of one of the SiO2 transistor devices made by Frosch and Derrick<ref name="auto2"/>]] In 1955, [[Carl Frosch]] and Lincoln Derick accidentally grew a layer of silicon dioxide over the silicon wafer, for which they observed surface passivation effects.<ref name=":0"/><ref>{{Cite patent|number=US2802760A|title=Oxidation of semiconductive surfaces for controlled diffusion|gdate=1957-08-13|invent1=Lincoln|invent2=Frosch|inventor1-first=Derick|inventor2-first=Carl J.|url=https://patents.google.com/patent/US2802760A}}</ref> By 1957 Frosch and Derick, using masking and predeposition, were able to manufacture silicon dioxide field effect transistors; the first planar transistors, in which drain and source were adjacent at the same surface.<ref name="auto2"/> They showed that silicon dioxide insulated, protected silicon wafers and prevented dopants from diffusing into the wafer.<ref name=":0" /><ref name="auto2"/> After this, J.R. Ligenza and W.G. Spitzer studied the mechanism of thermally grown oxides, fabricated a high quality Si/[[Silicon dioxide|SiO<sub>2</sub>]] stack and published their results in 1960.<ref>{{Cite journal |last1=Ligenza |first1=J. R. |last2=Spitzer |first2=W. G. |date=July 1, 1960 |title=The mechanisms for silicon oxidation in steam and oxygen |url=https://linkinghub.elsevier.com/retrieve/pii/0022369760902195 |journal=Journal of Physics and Chemistry of Solids |volume=14 |pages=131β136 |doi=10.1016/0022-3697(60)90219-5 |bibcode=1960JPCS...14..131L |issn=0022-3697}}</ref><ref name="Deal2">{{cite book |last1=Deal |first1=Bruce E. |title=Silicon materials science and technology |date=1998 |publisher=[[The Electrochemical Society]] |isbn=978-1566771931 |page=183 |chapter=Highlights Of Silicon Thermal Oxidation Technology |chapter-url=https://books.google.com/books?id=cr8FPGkiRS0C&pg=PA183}}</ref><ref>{{cite book |last1=Lojek |first1=Bo |title=History of Semiconductor Engineering |date=2007 |publisher=Springer Science & Business Media |isbn=978-3540342588 |page=322}}</ref> Following this research, [[Mohamed Atalla]] and [[Dawon Kahng]] proposed a silicon MOS transistor in 1959<ref name="Bassett22">{{cite book |last1=Bassett |first1=Ross Knox |url=https://books.google.com/books?id=UUbB3d2UnaAC&pg=PA22 |title=To the Digital Age: Research Labs, Start-up Companies, and the Rise of MOS Technology |date=2007 |publisher=[[Johns Hopkins University Press]] |isbn=978-0-8018-8639-3 |pages=22β23}}</ref> and successfully demonstrated a working MOS device with their Bell Labs team in 1960.<ref>{{cite journal |last1=Atalla |first1=M. |author1-link=Mohamed Atalla |last2=Kahng |first2=D. |author2-link=Dawon Kahng |date=1960 |title=Silicon-silicon dioxide field induced surface devices |journal=IRE-AIEE Solid State Device Research Conference}}</ref><ref>{{cite journal |title=1960 β Metal Oxide Semiconductor (MOS) Transistor Demonstrated |url=https://www.computerhistory.org/siliconengine/metal-oxide-semiconductor-mos-transistor-demonstrated/ |journal=The Silicon Engine |publisher=[[Computer History Museum]] |access-date=January 16, 2023}}</ref> Their team included E. E. LaBate and E. I. Povilonis who fabricated the device; M. O. Thurston, L. A. DβAsaro, and J. R. Ligenza who developed the diffusion processes, and H. K. Gummel and R. Lindner who characterized the device.<ref name="auto3"/><ref name="auto4"/> With its [[MOSFET scaling|high scalability]],<ref>{{cite journal |last1=Motoyoshi |first1=M. |title=Through-Silicon Via (TSV) |journal=Proceedings of the IEEE |date=2009 |volume=97 |issue=1 |pages=43β48 |doi=10.1109/JPROC.2008.2007462 |s2cid=29105721 |url=https://pdfs.semanticscholar.org/8a44/93b535463daa7d7317b08d8900a33b8cbaf4.pdf |archive-url=https://web.archive.org/web/20190719120523/https://pdfs.semanticscholar.org/8a44/93b535463daa7d7317b08d8900a33b8cbaf4.pdf |url-status=dead |archive-date=July 19, 2019 |issn=0018-9219}}</ref> much lower power consumption, and higher density than bipolar junction transistors,<ref>{{cite news |title=Transistors Keep Moore's Law Alive |url=https://www.eetimes.com/author.asp?section_id=36&doc_id=1334068 |access-date=July 18, 2019 |work=[[EETimes]] |date=December 12, 2018}}</ref> the MOSFET made it possible to build [[Large scale integration|high-density]] integrated circuits,<ref name="computer history-transistor">{{cite web |title=Who Invented the Transistor? |url=https://www.computerhistory.org/atchm/who-invented-the-transistor/ |website=[[Computer History Museum]] |date=December 4, 2013 |access-date=July 20, 2019}}</ref> allowing the integration of more than 10,000 transistors in a single IC.<ref>{{cite journal |last1=Hittinger |first1=William C. |title=Metal-Oxide-Semiconductor Technology |journal=Scientific American |date=1973 |volume=229 |issue=2 |pages=48β59 |issn=0036-8733|jstor=24923169 |doi=10.1038/scientificamerican0873-48 |bibcode=1973SciAm.229b..48H }}</ref> Bardeen and Brattain's 1948 inversion layer concept forms the basis of CMOS technology today.<ref>{{cite book |author=Howard R. Duff |title=AIP Conference Proceedings |date=2001 |volume=550 |pages=3β32 |chapter=John Bardeen and transistor physics |doi=10.1063/1.1354371 |doi-access=free}}</ref> The [[CMOS]] (complementary [[MOSFET|MOS]]) was invented by [[Chih-Tang Sah]] and [[Frank Wanlass]] at [[Fairchild Semiconductor]] in 1963.<ref name="computerhistory1963">{{cite web |title=1963: Complementary MOS Circuit Configuration is Invented |url=https://www.computerhistory.org/siliconengine/complementary-mos-circuit-configuration-is-invented/ |website=[[Computer History Museum]] |access-date=July 6, 2019}}</ref> The first report of a [[floating-gate MOSFET]] was made by Dawon Kahng and [[Simon Sze]] in 1967.<ref>D. Kahng and S. M. Sze, "A floating gate and its application to memory devices", ''The Bell System Technical Journal'', vol. 46, no. 4, 1967, pp. 1288β1295</ref> In 1967, Bell Labs researchers Robert Kerwin, [[Donald L. Klein|Donald Klein]] and John Sarace developed the [[self-aligned gate]] (silicon-gate) MOS transistor, which Fairchild Semiconductor researchers [[Federico Faggin]] and Tom Klein used to develop the first [[silicon-gate]] MOS [[integrated circuit]].<ref name="computerhistory1968">{{cite web |title=1968: Silicon Gate Technology Developed for ICs |url=https://www.computerhistory.org/siliconengine/silicon-gate-technology-developed-for-ics/ |access-date=July 22, 2019 |website=[[Computer History Museum]]}}</ref> A [[double-gate]] MOSFET was first demonstrated in 1984 by [[Electrotechnical Laboratory]] researchers Toshihiro Sekigawa and Yutaka Hayashi.<ref>{{cite book |last1=Colinge |first1=J.P. |title=FinFETs and Other Multi-Gate Transistors |date=2008 |publisher=Springer Science & Business Media |isbn=9780387717517 |page=11 |url=https://books.google.com/books?id=t1ojkCdTGEEC&pg=PA11}}</ref><ref>{{cite journal |last1=Sekigawa |first1=Toshihiro |last2=Hayashi |first2=Yutaka |title=Calculated threshold-voltage characteristics of an XMOS transistor having an additional bottom gate |journal=Solid-State Electronics |date=August 1, 1984 |volume=27 |issue=8 |pages=827β828 |doi=10.1016/0038-1101(84)90036-4 |issn=0038-1101|bibcode=1984SSEle..27..827S }}</ref> The [[FinFET]] (fin field-effect transistor), a type of 3D non-planar [[Multigate device|multi-gate]] MOSFET, originated from the research of Digh Hisamoto and his team at [[Hitachi|Hitachi Central Research Laboratory]] in 1989.<ref>{{cite web |title=IEEE Andrew S. Grove Award Recipients |url=https://www.ieee.org/about/awards/bios/grove-recipients.html |archive-url=https://web.archive.org/web/20180909112404/https://www.ieee.org/about/awards/bios/grove-recipients.html |url-status=dead |archive-date=September 9, 2018 |website=[[IEEE Andrew S. Grove Award]] |publisher=[[Institute of Electrical and Electronics Engineers]] |access-date=July 4, 2019}}</ref><ref>{{cite web |title=The Breakthrough Advantage for FPGAs with Tri-Gate Technology |url=https://www.intel.com/content/dam/www/programmable/us/en/pdfs/literature/wp/wp-01201-fpga-tri-gate-technology.pdf |publisher=[[Intel]] |year=2014 |access-date=July 4, 2019}}</ref>
Edit summary
(Briefly describe your changes)
By publishing changes, you agree to the
Terms of Use
, and you irrevocably agree to release your contribution under the
CC BY-SA 4.0 License
and the
GFDL
. You agree that a hyperlink or URL is sufficient attribution under the Creative Commons license.
Cancel
Editing help
(opens in new window)