Open main menu
Home
Random
Recent changes
Special pages
Community portal
Preferences
About Wikipedia
Disclaimers
Incubator escapee wiki
Search
User menu
Talk
Dark mode
Contributions
Create account
Log in
Editing
Debye length
(section)
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
== In semiconductors == The Debye length has become increasingly significant in the modeling of solid state devices as improvements in lithographic technologies have enabled smaller geometries.<ref>{{cite journal| doi = 10.1021/nl071792z| volume = 7| issue = 11| pages = 3405–3409| last = Stern| first = Eric|author2=Robin Wagner |author3=Fred J. Sigworth |author4=Ronald Breaker |author5=Tarek M. Fahmy |author6=Mark A. Reed | title = Importance of the Debye Screening Length on Nanowire Field Effect Transistor Sensors| journal = Nano Letters| date = 2007-11-01|bibcode = 2007NanoL...7.3405S | pmid=17914853 | pmc=2713684}}</ref><ref>{{cite journal|last=Guo|first=Lingjie|author2=Effendi Leobandung|author3=Stephen Y. Chou|year=199|title=A room-temperature silicon single-electron metal–oxide–semiconductor memory with nanoscale floating-gate and ultranarrow channel|journal=Applied Physics Letters|volume=70|issue=7|pages=850|bibcode=1997ApPhL..70..850G|doi=10.1063/1.118236}}<!--| access-date = 2010-10-25--></ref><ref>{{cite journal |last=Tiwari| first=Sandip| author2=Farhan Rana| author3=Kevin Chan|author4=Leathen Shi| author5=Hussein Hanafi|year=1996 |title=Single charge and confinement effects in nano-crystal memories| journal=Applied Physics Letters |volume=69 |issue=9|pages=1232|bibcode=1996ApPhL..69.1232T|doi=10.1063/1.117421}}<!--| access-date = 2010-10-25--></ref> The Debye length of [[semiconductor]]s is given: <math display="block"> L_\text{D} = \sqrt{\frac{\varepsilon k_\text{B} T}{q^2 N_\text{dop}}}</math> where * {{math|''ε''}} is the dielectric constant, * {{math|''k''<sub>B</sub>}} is the Boltzmann constant, * {{math|''T''}} is the absolute temperature in kelvins, * {{math|''q''}} is the elementary charge, and * {{math|''N''<sub>dop</sub>}} is the net density of dopants (either donors or acceptors). When doping profiles exceed the Debye length, majority carriers no longer behave according to the distribution of the dopants. Instead, a measure of the profile of the doping gradients provides an "effective" profile that better matches the profile of the majority carrier density. In the context of solids, [[Thomas–Fermi screening length]] may be required instead of Debye length.
Edit summary
(Briefly describe your changes)
By publishing changes, you agree to the
Terms of Use
, and you irrevocably agree to release your contribution under the
CC BY-SA 4.0 License
and the
GFDL
. You agree that a hyperlink or URL is sufficient attribution under the Creative Commons license.
Cancel
Editing help
(opens in new window)