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Wafer testing
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==Bibliography== * Fundamentals of Digital Semiconductor Testing (Version 4.0) by Guy A. Perry (Spiral-bound β Mar 1, 2003) {{ISBN|978-0965879705}} * Principles of Semiconductor Network Testing (Test & Measurement) (Hardcover)by Amir Afshar, 1995 {{ISBN|978-0-7506-9472-8}} <!-- http://www.sciencedirect.com/science/book/9780750694728 --> * Power-Constrained Testing of VLSI Circuits. A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicola Nicolici and Bashir M. Al-Hashimi (Kindle Edition β Feb 28, 2003) {{ISBN|978-0-306-48731-6}} * Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma (Hardcover β Sep 9, 2002) {{ISBN|978-0780310001}} {{DEFAULTSORT:Wafer testing }} [[Category:Semiconductor device fabrication]]
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