Open main menu
Home
Random
Recent changes
Special pages
Community portal
Preferences
About Wikipedia
Disclaimers
Incubator escapee wiki
Search
User menu
Talk
Dark mode
Contributions
Create account
Log in
Editing
High-electron-mobility transistor
(section)
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
=== Electrostatic mechanism === {{main|Heterojunction}} Since GaAs has higher [[electron affinity]], free electrons in the AlGaAs layer are transferred to the undoped GaAs layer where they form a two dimensional high mobility electron gas within 100 [[ångström]] (10 [[nanometre|nm]]) of the interface. The n-type AlGaAs layer of the HEMT is depleted completely through two depletion mechanisms: * Trapping of free electrons by surface states causes the surface depletion. * Transfer of electrons into the undoped GaAs layer brings about the interface depletion. The [[Fermi level]] of the gate metal is matched to the pinning point, which is 1.2 [[Electron volt|eV]] below the conduction band. With the reduced AlGaAs layer thickness, the electrons supplied by donors in the AlGaAs layer are insufficient to pin the layer. As a result, band bending is moving upward and the two-dimensional electrons gas does not appear. When a positive voltage greater than the threshold voltage is applied to the gate, electrons accumulate at the interface and form a two-dimensional electron gas.
Edit summary
(Briefly describe your changes)
By publishing changes, you agree to the
Terms of Use
, and you irrevocably agree to release your contribution under the
CC BY-SA 4.0 License
and the
GFDL
. You agree that a hyperlink or URL is sufficient attribution under the Creative Commons license.
Cancel
Editing help
(opens in new window)