Editing Soft error (section)

=== Other causes ===
Soft errors can also be caused by [[random noise]] or [[signal integrity]] problems, such as inductive or capacitive [[crosstalk]]. However, in general, these sources represent a small contribution to the overall soft error rate when compared to radiation effects.

Some tests conclude that the isolation of [[DRAM]] memory cells can be circumvented by unintended side effects of specially crafted accesses to adjacent cells.  Thus, accessing data stored in DRAM causes memory cells to leak their charges and interact electrically, as a result of high cells density in modern memory, altering the content of nearby memory rows that actually were not addressed in the original memory access.<ref name="kyungbae">{{cite book |author-first1=Kyungbae |author-last1=Park |author-first2=Sanghyeon |author-last2=Baeg |author-first3=ShiJie |author-last3=Wen |author-first4=Richard |author-last4=Wong |title=2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) |chapter=Active-precharge hammering on a row induced failure in DDR3 SDRAMs under 3× nm technology |pages=82–85 |publisher=[[IEEE]] |date=October 2014 |doi=10.1109/IIRW.2014.7049516 |isbn=978-1-4799-7308-8|s2cid=14464953 }}</ref>  This effect is known as [[row hammer]], and it has also been used in some [[privilege escalation]] computer security [[Exploit (computer security)|exploits]].<ref>{{cite web |url=http://users.ece.cmu.edu/~yoonguk/papers/kim-isca14.pdf |title=Flipping Bits in Memory Without Accessing Them: An Experimental Study of DRAM Disturbance Errors |date=2014-06-24 |access-date=2015-03-10 |author-first1=Yoongu |author-last1=Kim |author-first2=Ross |author-last2=Daly |author-first3=Jeremie |author-last3=Kim |author-first4=Chris |author-last4=Fallin |author-first5=Ji Hye |author-last5=Lee |author-first6=Donghyuk |author-last6=Lee |author-first7=Chris |author-last7=Wilkerson |author-first8=Konrad |author-last8=Lai |author-first9=Onur |author-last9=Mutlu |publisher=[[IEEE]] |website=ece.cmu.edu}}</ref><ref>{{cite web |url=https://arstechnica.com/security/2015/03/cutting-edge-hack-gives-super-user-status-by-exploiting-dram-weakness/ |title=Cutting-edge hack gives super user status by exploiting DRAM weakness |date=2015-03-10 |access-date=2015-03-10 |author-first=Dan |author-last=Goodin |publisher=[[Ars Technica]]}}</ref>