Editing Scanning probe microscopy (section)

==Disadvantages==
The detailed shape of the scanning tip is sometimes difficult to determine. Its effect on the resulting data is particularly noticeable if the specimen varies greatly in height over lateral distances of 10&nbsp;nm or less.

The scanning techniques are generally slower in acquiring images, due to the scanning process. As a result, efforts are being made to greatly improve the scanning rate. Like all scanning techniques, the embedding of spatial information into a time sequence opens the door to uncertainties in metrology, say of lateral spacings and angles, which arise due to time-domain effects like specimen drift, feedback loop oscillation, and mechanical vibration.

The maximum image size is generally smaller.

Scanning probe microscopy is often not useful for examining buried solid-solid or liquid-liquid interfaces.