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Electron ionization
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==== Characterization of synthetic carbon clusters ==== Another application of direct insertion EI-MS is the characterization of novel synthetic [[carbon]] clusters isolated in the solid phase. These crystalline materials consist of [[Buckminsterfullerene|C<sub>60</sub>]] and [[C70 fullerene|C<sub>70</sub>]] in the ratio of 37:1. In one investigation it has been shown that the synthetic C<sub>60</sub> molecule is remarkably stable and that it retains its [[Aromaticity|aromatic]] character.<ref>{{Cite journal|last1=Luffer|first1=Debra R.|last2=Schram|first2=Karl H.|date=1990-12-01|title=Electron ionization mass spectrometry of synthetic C60|journal=Rapid Communications in Mass Spectrometry|language=en|volume=4|issue=12|pages=552β556|doi=10.1002/rcm.1290041218|issn=1097-0231|bibcode=1990RCMS....4..552L}}</ref>
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