Editing Ellipsometry (section)

===Standard vs. generalized ellipsometry (anisotropy)===
Standard ellipsometry (or just short 'ellipsometry') is applied, when no ''s'' polarized light is converted into ''p'' polarized light nor vice versa. This is the case for optically isotropic samples, for instance, [[amorphous]] materials or [[crystalline]] materials with a [[cubic crystal]] structure. Standard ellipsometry is also sufficient for optically [[uniaxial]] samples in the special case, when the optical axis is aligned parallel to the surface normal. In all other cases, when ''s'' polarized light is converted into ''p'' polarized light and/or vice versa, the generalized ellipsometry approach must be applied.  Examples are arbitrarily aligned, optically uniaxial samples, or optically biaxial samples.