Editing Semiconductor detector (section)

=== Radioactive Waste Assay Machines ===
Semiconductor detectors especially HPGe are often integrated into devices for characterising packaged radioactive waste. This can be as simple as detectors being mounted on a moveable platform to be brought to an area for in-situ measurements and paired with shielding to restrict the field-of-view of the detector to the area of interest for one-shot "open detector geometry" measurements,<ref>ISO 19017:2015</ref> or for waste in drums, systems such as the Segmented Gamma Scanner (SGS) combine a semiconductor detector with integrated [[mechatronics]] to rotate the item and scan the detector across different sections.<ref>LALP-91-011, Application Note, Segmented Gamma-Ray Scanner</ref> If the detector field of view is scanned across small areas of the item in multiple axes as is done with a Tomographic Gamma Scanner (TGS), [[Tomography]] can be used to extract 3D information about the density and gamma emissions of the item.<ref>LA-UR-93-1637, Tomographic gamma scanning (TGS) to measure inhomogeneous nuclear material matrices from future fuel cycles, LANL, 1993</ref>